• Requirements & Compliance Definition (use case, UL/IEC, targets)
• Cell Selection & Validation (chemistry, supplier, screening tests)
• System Architecture (S/P config, voltage, energy, rack/container layout)
• Electrical Design (busbars, fuses, contactors, pre-charge, wiring)
• Thermal Design (air/liquid cooling, CFD, temperature uniformity)
• Mechanical Design (module/pack enclosure, IP rating, structural safety)
• Structural Simulation (Lifting, Vibration, Shock, Crush, Drop, and Thermal)
• BMS Development (SOC/SOH, balancing, protections, comms)
• Safety & Protection Strategy (fault detection, venting, TR mitigation)
• Prototype Builds: EVT — DVT — PVT (engineering — validation — pilot)
• Testing & Certification (performance, abuse, UN38.3, UL9540/9540A)
• Manufacturing Readiness (DFMA, PFMEA, tooling, EOL testing)
• SOP & Field Support (ramp-up, monitoring, feedback loop)

• Modal and harmonic analysis of the enclosure to identify natural frequencies
• Random vibration simulations for road load durability
• Fatigue life of mounting brackets and fasteners under cyclic loads
• Vibration-induced damage to internal components (e.g., connectors, busbars)
• MIL-STD-810H — Environmental vibration, shock, and mechanical loads

Local Component Validation

• Base plate stiffness and deformation under mechanical and thermal loads
• Cell tray deformation due to battery weight and expansion forces
• Cover warpage under bolt load, sealing pressure, or external impact
• Reinforcement and rib design effectiveness in high-stress zones

Thermo-Structural Coupled Analysis

• Thermal expansion-induced stresses in the base plate, casing, and lids
• Validate bolt preload variation and sealing performance under temperature cycles
• Fatigue life degradation analysis from mechanical and thermal cycling

Electro-Thermal Analysis

• Model heat generation from battery cells based on current flow and internal resistance
• Evaluate temperature rise and dissipation across cell trays, barriers, and casings
• Assess thermal runaway propagation risk under internal short circuit or cell failure